На уровень вверх |
Trifonov Artem/A., Presnov /D.E, Bozhev /I.V., Evplov /D.A., Desmaris /V., Krupenin /V.A. Non-contact scanning probe technique for electrique field measurements based on nanowire field-effect transistor. Ultramicroscopy , 2017 (179). С. 33-40.
Bozhev /I., Trifonov Artem/A., Presnov /D., Krupenin /V. Silicon Nanowire-based local field probe. International Conference "Micro- and nanoelectonics-2016"October 3-7 2016, Moscow, Zvenigorod, Russia , 2016 .
Trifonov Artem/A., Dagesyan /S., Shorokhov /V., Presnov /D., Soldatov /E., Krupenin Vladimir/V. Single Electron Transistors based on single moleculs and atoms. Internationa Conference "Micro- and Nanoelectronics 2016", 3-7 october, 2016 Moscow-Zvenigorod, Russia , 2016 .