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Sharath S. U., Joseph M. J., Vogel S., Hildebrandt E., Komissinskiy P., Kurian J., Schroeder T., Alff L. Impact of oxygen stoichiometry on electroforming and multiple switching modes in TiN/TaOx/Pt based ReRAM. Applied Physics Letters , 2016 , 109 (17). р. 173503. ISSN 0003-6951
Sharath S. U., Kurian J., Komissinskiy P., Hildebrandt E., Bertaud T., Walczyk C., Calka P., Schroeder T., Alff L. Thickness independent reduced forming voltage in oxygen engineered HfO2 based resistive switching memories. Applied Physics Letters , 2014 , 105 (7). 073505. ISSN 0003-6951