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Goldman E. I., Kuharskaya N. F., Levashov S.A., Chucheva G.V. Determination of the Parameters of Metal–Insulator–Semiconductor Structures with Ultrathin Insulating Layer from High-Frequency Capacitance–Voltage Measurements. Semiconductors , 2019 , 53 (1). С. 42-45. ISSN 1063-7826
Afanasiev M.S., Egorov V.K., Egorov E.V., Kuharskaya N. F., Nabiev A.E., Naryshkina V.G. The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation. Instruments and Experimental Techniques , 2019 . ISSN 0020-4412