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Sharath S. U., Joseph M. J., Vogel S., Hildebrandt E., Komissinskiy P., Kurian J., Schroeder T., Alff L. Impact of oxygen stoichiometry on electroforming and multiple switching modes in TiN/TaOx/Pt based ReRAM. Applied Physics Letters , 2016 , 109 (17). р. 173503. ISSN 0003-6951