Объекты, где автором является "Egorov V.K."

На уровень вверх
Экспорт в [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Группировка по: Тип объекта | Нет группировки
Количество объектов: 9.

Статья

Afanasiev M.S., Egorov E.V., Egorov V.K., Chucheva G.V. Elemental Analysis of Materials by Methods of Ion-Beam Diagnostics. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques , 2021 , 15 (4). С. 712-716. ISSN 1027-4510

Egorov V.K., Egorov E.V., Kalin B.A., Safronov D.A. Nondestructive Elemental Diagnostics of the Fuel-Rod Cladding Surface by the Ion-Beam and X-Ray Analytical Methods. Instruments and Experimental Techniques , 2021 , 64 (1). С. 63-70. ISSN 00204412

Afanasiev M.S., Egorov V.K., Egorov E.V., Kuharskaya N. F., Nabiev A.E., Naryshkina V.G. The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation. Instruments and Experimental Techniques , 2019 . ISSN 0020-4412

Egorov V.K., Egorov E.V., Afanas’ev M.S. Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings. Physics of the Solid State , 2019 , 61 (12). С. 2480-2486. ISSN 1063-7834,

Egorov V.K., Egorov E.V., Afanasiev M.S. X-ray fluorescence material analysis initiated by high energy proton beams. Journal of Physics: Conference Series , 2018 , 1121. 012011-1-012011-6. ISSN 1742-6588

Egorov V.K., Egorov E.V., Afanas’ev M.S. TXRF spectrometry at ion beam extraction. Journal of Physics: Conference Series , 2017 , 808. 012002-1-012002-4. ISSN 1742-6588

Egorov E.V., Afanas’ev M.S., Egorov V.K. Progress in TXRX spectrometry achieved by modified waveguide-resonator application. Advanced X-Ray Chemical Analysis Japan , 2016 , 47. С. 119-124.

Раздел книги

Egorov E.V., Egorov V.K. Radiation fluxes waveguide-resonance phenomenon discovered in result of X-ray nanosize beam formation study. In: “Electromagnetic propagation and waveguides in photonics and microwave engineering”, Chapter 3. Eds. P. Steiglich. London: Intech Open Press. (2020) P. 42-62. IntechOpen Limited, London , 2020 , С. 42-62.

Доклад на конференции или семинаре

Egorov V.K., Egorov E.V., Afanas’ev M.S. Element analysis of thin films and liquid dry residue by X-ray and ion beam methods. In: 14th International Conference on Films and Coatings 14–16 May 2019, Saint Petersburg, Russian Federation, 14–16 May 2019, Saint Petersburg, , Published under licence by IOP Publishing Ltd , С. 1-4.

Этот список был создан Wed May 8 23:37:00 2024 GMT-3.