 | На уровень вверх |
Sharma S., Hildebrandt E., Major M., Komissinskiy P., Radulov I., Alff L. CeCo5 thin films with perpendicular anisotropy grown by molecular beam epitaxy. Journal of Magnetism and Magnetic Materials , 2018 , 452. С. 80-85. ISSN 03048853
Rodenbücher C., Hildebrandt E., Szot K., Sharath S. U., Kurian J., Komissinskiy P., Breuer U., Waser R., Alff L. Hafnium carbide formation in oxygen deficient hafnium oxide thin films. Applied Physics Letters , 2016 , 108 (25). р. 252903. ISSN 0003-6951
Sharath S. U., Joseph M. J., Vogel S., Hildebrandt E., Komissinskiy P., Kurian J., Schroeder T., Alff L. Impact of oxygen stoichiometry on electroforming and multiple switching modes in TiN/TaOx/Pt based ReRAM. Applied Physics Letters , 2016 , 109 (17). р. 173503. ISSN 0003-6951
Hirsch S., Komissinskiy P., Flege S., Li S., Rachut K., Klein A., Alff L. Modification of energy band alignment and electric properties of Pt/Ba0.6Sr0.4TiO3/Pt thin-film ferroelectric varactors by Ag impurities at interfaces. Journal of Applied Physics , 2014 , 115 (24). р. 243704. ISSN 0021-8979
Shabadi V., Major M., Komissinskiy P., Vafaee M., Radetinac A., Baghaie Yazdi M., Donner W., Alff L. Origin of superstructures in (double) perovskite thin films. Journal of Applied Physics , 2014 , 116 (11). р. 114901. ISSN 0021-8979
Sharath S. U., Kurian J., Komissinskiy P., Hildebrandt E., Bertaud T., Walczyk C., Calka P., Schroeder T., Alff L. Thickness independent reduced forming voltage in oxygen engineered HfO2 based resistive switching memories. Applied Physics Letters , 2014 , 105 (7). 073505. ISSN 0003-6951
