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Egorov V.K., Egorov E.V., Afanas’ev M.S. TXRF spectrometry at ion beam extraction. Journal of Physics: Conference Series , 2017 , 808. 012002-1-012002-4. ISSN 1742-6588
Egorov E.V., Afanas’ev M.S., Egorov V.K. Progress in TXRX spectrometry achieved by modified waveguide-resonator application. Advanced X-Ray Chemical Analysis Japan , 2016 , 47. С. 119-124.
Egorov V.K., Egorov E.V., Afanas’ev M.S. Element analysis of thin films and liquid dry residue by X-ray and ion beam methods. In: 14th International Conference on Films and Coatings 14–16 May 2019, Saint Petersburg, Russian Federation, 14–16 May 2019, Saint Petersburg, , Published under licence by IOP Publishing Ltd , С. 1-4.
