Afanasiev M.S., Egorov V.K., Egorov E.V., Kuharskaya N. F., Nabiev A.E., Naryshkina V.G. The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation. Instruments and Experimental Techniques , 2019 . ISSN 0020-4412
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Аннотация
The features of methods for total-reflection X-ray fluorescence analysis with proton-induced X-ray fluorescence emission are described. A setup for obtaining X-ray fluorescence spectra under the conditions of proton-beam excitation has been developed using these methods. The setup is based on a specially designed planar X-ray waveguide resonator. The features of the new experimental diagnostic method in the unique research facility (UNU no. 45) of the Sokol-3 analytical ion-beam complex are discussed; some attention has been paid to the description of the capabilities of this facility
Тип объекта: | Статья |
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Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Афанасьев М.С., Егоров В.К., Егоров Е.В., Кухарская Н.Ф., Набиев А.Е., Нарышкина В.Г. |
Подразделения (можно выбрать несколько, удерживая Ctrl): | 251 лаб. исследования физических явлений на поверхности и границах раздела твердых тел |
URI: | http://cplire.ru:8080/id/eprint/9934 |
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