Temiryazev Alexei, Frolov Alexey, Temiryazeva Marina Atomic-force microscopy study of self-assembled atmospheric contamination on graphene and graphite surfaces. Carbon , 2019 , 143. С. 30-37. ISSN 00086223
Полный текст не доступен из этого репозитория.Аннотация
By means of high resolution atomic-force microscopy (AFM) we investigated the surface of graphene and graphite. Our study shows that if the samples were stored in ambient laboratory conditions, an adsorbate of airborne contaminants, presumably hydrocarbons, forms well-ordered layer over the whole area of graphene flakes. In general case, this layer has a stripe structure of 4e5 nm pitch with domains differing in the direction of the stripes. The size of one domain can exceed 100 mm2, which means that almost the entire area of a graphene flake can be under a layer with a constant stripe direction. By mechanical impact of AFM probe, we can turn the direction of the stripe structure, while its pitch is preserved. Visualization of the self-assembled structure may be hampered by the presence of non-ordered overlayer.
| Тип объекта: | Статья |
|---|---|
| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Темирязев Алексей, Фролов Алексей, Темирязева марина |
| Подразделения (можно выбрать несколько, удерживая Ctrl): | 184 лаб. методов получения тонких пленок и пленочных структур 196 лаб. спин-волновых процессов в миллиметровом и субмиллиметровом диапазонах длин волн |
| URI: | http://cplire.ru:8080/id/eprint/9576 |
 |
Изменить объект |
