Afanasiev M.S., Egorov E.V., Egorov V.K., Chucheva G.V. Elemental Analysis of Materials by Methods of Ion-Beam Diagnostics. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques , 2021 , 15 (4). С. 712-716. ISSN 1027-4510
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Аннотация
A brief description of the ion-beam analytical complex used for the work is given. The possibilities of elemental analysis of the materials as a result of using the methods of Rutherford ion backscattering and X‑ray fluorescence under ionic excitation are shown. A brief description of these methods and the conditions for their implementation is given. It is shown that the highest efficiency of elemental analysis is achieved when they are applied together. Experimental data showing the efficiency of using such an analysis in diagnostics of the elemental composition of residues of dry liquids and solid materials, including thin-film ferroelectric films, are presented.
| Тип объекта: | Статья |
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| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Афанасьев М.С., Егоров Е.В., Егоров В.К., Чучева Г.В. |
| Подразделения (можно выбрать несколько, удерживая Ctrl): | 251 лаб. исследования физических явлений на поверхности и границах раздела твердых тел |
| URI: | http://cplire.ru:8080/id/eprint/8150 |
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