MEASUREMENT OF DIELECTRIC LOSS AT MILLIMETER RANGE IN THE LOW LOSS MATERIALS WITH ARBITRARY RATIO OF WAVELENGTH AND SAMPLE THICKNESS

Chigryai E.E., Garin B.M., Denisyuk R.N. MEASUREMENT OF DIELECTRIC LOSS AT MILLIMETER RANGE IN THE LOW LOSS MATERIALS WITH ARBITRARY RATIO OF WAVELENGTH AND SAMPLE THICKNESS. JOURNAL OF RADIO ELECTRONICS (ZHURNAL RADIOELEKTRONIKI), ISSN 1684-1719, N10, 2018 , 2018 (10). С. 1-7. ISSN 1684-1719,

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Аннотация

For the first time the measurement technique is developed for dielectric loss in the low loss materials at the long-wave part of the millimeter range of electromagnetic waves on the basis of compact open semi-symmetric confocal resonator for the samples with arbitrary ratio of the sample thickness and wavelength in the dielectric material. The loss in the aluminum oxide ceramics (Al2O3) of the brand VK-99 was measured at room temperature at the frequency 69.4 GHz: tanδ = 3.1104. This value is close to the corresponding value in the aluminium oxide ceramics Al2O3 of the Russian production of the brand VK100M, and it is lower than in the corresponding ceramics of the Chinese production [5]. In addition, this value is close to the loss in the single crystal of Al2O3 (sapphire). This indicates a very high quality of the modern Russian ceramics of aluminum oxide.

Тип объекта:	Статья
Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!:	Чигряй Е.Е., Гарин Б.М., Денисюк Р.Н.
Подразделения (можно выбрать несколько, удерживая Ctrl):	139 лаб. оптических волноводных систем
URI:	http://cplire.ru:8080/id/eprint/5649

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