Mkrtchyan F.A., Kovalev V.V. LED ellipsometry and photometry in monitoring aquatic environment. In: 33th International Symposium on Okhotsk Sea & Polar Oceans, 18-21 February 2018, Mombetsu, Hokkaido, Japan, , The Okhotsk Sea& Cold Ocean Research Association , С. 151-154.
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Ellipsometry and photometry is an optical technique that uses the change in the state of polarization of light upon reflection and refraction for the in-situ and real-time characterization of surfaces, interfaces, thin films in the physics, and liquid solutions in the hydrochemical investigations. In the solid physics, spectroellipsometry gives possibility to measure simultaneously amplitude and phase characteristics of studied object and allows the precise definition of the film thickness and optical constants for film material. The diagnostics of liquids gives possibility to assess the concentration of chemicals dissolved and weighed in the liquid as well as to determine the spots of pollutants on the water surface. The need to measure small concentrations of water pollution requires translucence with respect to thick layers when measuring the absorption coefficient. Good collimation of beams and a high signal-to-noise ratio are provided by LED radiation sources. In this work we consider the developed by us in V.A. Kotelnikov’s Institute of Radioengineering and Electronics constructively simple automatic photometer-refractometer with high metrological capabilities, which uses a set of 8 LEDs with peak wavelengths of radiation from 365 nm to 780 nm.
| Тип объекта: | Доклад на конференции или семинаре (Доклад) |
|---|---|
| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Мкртчян Ф.А., Ковалев В.В. |
| Подразделения (можно выбрать несколько, удерживая Ctrl): | 209 лаб. вычислительная |
| URI: | http://cplire.ru:8080/id/eprint/4503 |
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