Mkrtchyan F.A., Kovalev V.V. Development spectroellipsometric technology for the diagnosis of aquatic environments. In: SPIE International conference “Optics + Photonics”(SPIE-2017), 06 – 10 August , 2017,, San Diego, California, USA , SPIE , р. 537.
Полный текст не доступен из этого репозитория.Аннотация
Spectroellipsometry methods used for non-destructive investigation of chemical and physical properties of solids and liquids. These methods are based on detection of optical polarization effects arising from the reflection or distortion of a light wave in the interaction with the analyte. In solid state physics spectroellipsometry allows simultaneous measurement of amplitude and phase characteristics of the test sample and accurately determine both film thickness and optical constants of the film material. In the diagnosis of liquids are given the opportunity to assess the concentration of dissolved and suspended chemicals, as well as to determine the spots of pollutants of the water surface. There are several major trends in modern ellipsomery. This spectroellipsometry polarization rotating elements with a photoelastic modulators speed and dividing the radiation beam reflected from the sample to multiple channels with different polarization states and several photodetectors. In V.A. Kotelnikov’s Institute of Radioengiheering and Electronics, RAS developed spectroellipsometer a method with the binary modulation of the polarization state, based on the elemental base polarization optics for measurements in a wide spectral range and non-moving polarization elements. This approach provides spectral image of the test sample in a specific spectral range, which enables using mathematical techniques to evaluate the chemical and physical characteristics of this sample. In essence, it is necessary to solve the inverse problem of multi-channel.
| Тип объекта: | Доклад на конференции или семинаре (Доклад) |
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| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Мкртчян Ф.А., Ковалев В.В. |
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| URI: | http://cplire.ru:8080/id/eprint/4269 |
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