Gan’shina E.A., Golik L.L., Kun’kova Z.E., Zykov G.S., Rukovishnikov A.I., Markin Yu.V. Magneto-optical detection of intrinsic ferromagnetism and phase separation in diluted magnetic semiconductors. In: VII Euro -Asian Symposium "Trends in MAGnetism" (EASTMAG-2019), September 08 – 13, 2019, Ekaterinburg, Russia , M.N. Miheev Institute of Metal Physics UB RAS , 294 (V. II)-294.
Полный текст не доступен из этого репозитория. (Заказать копию)Аннотация
Modern techniques of characterization, including X-ray diffraction, X-ray magnetic circular dichroism, scanning electron microscopy, transmission electron microscopy are used in addition to common laboratory methods (magnetometry, magnetotransport measurements and others) when diluted magnetic semiconductors (DMSs) studying. Careful characterization is especially important when it is reported about the preparation of new DMSs, whose Curie temperature exceeds room temperature. Employing modern high-tech experimental methods is very desirable, but they are not always available. At the same time, magneto-optical (MO) spectroscopy, which is the well-known, relatively simple, high sensitivity and accessible technique, can be very useful for characterization and study of DMSs. If features in the region of the transitions at the critical points of the parent band structure are observed in MO spectra, it is evidence of intrinsic ferromagnetism of DMS. Using MO spectroscopy one can also obtain the information on the electronic and magnetic structures of DMSs as well as detect and identify secondary magnetic phases. Here, we show the efficiency of MO spectroscopy for studying new diluted magnetic materials by the example of (Ga,Mn)As.
Тип объекта: | Доклад на конференции или семинаре (Приглашенный доклад) |
---|---|
Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Ганьшина Е.А., Голик Л.Л., Кунькова З.Э., Зыков Г.С., Руковишников А.И., Маркин Ю.В. |
Подразделения (можно выбрать несколько, удерживая Ctrl): | 197 лаб. функциональной электроники 218 лаб. химических методов технологии и анализа |
URI: | http://cplire.ru:8080/id/eprint/9719 |
Изменить объект |