Optical coefficients of the layered structure with nanometer copper film in the frequency band 8.5 – 12.5 GHz, depending on the substrate thickness

Vdovin Vladimir, Andreev Valeriy, Pyataikin Ivan, Pinaev Yury Optical coefficients of the layered structure with nanometer copper film in the frequency band 8.5 – 12.5 GHz, depending on the substrate thickness. In: 2022 IEEE 8th All-Russian Microwave Conference (RMC), 23-25 ноября 2022, Москва, Россия , Institute of Electrical and Electronics Engineers , С. 357-360.

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Официальный URL: https://ieeexplore.ieee.org/document/10079526

Аннотация

The spectral dependence of the optical coefficients of ultrathin copper films 2 – 30 nm thick on the substrate thickness has been studied. The measurements were carried out in a rectangular waveguide in the frequency range 8.5–12.5 GHz for two orientations of the film with respect to the direction of the incident wave. 4 mm to a 4 mm substrate with a film. It is shown that the effect of anomalously high absorption of waves (more than 77%) by copper films no thicker than 10 nm is observed in a wide frequency band. The effect of extremely low reflection (0.06%) was registered when a wave of frequency 11.54 GHz is incident on a film 7.9 nm thick from the side of a 4-mm substrate. It is shown that the frequency range where the effect of minimal reflection was observed exceeds the antireflection band of a dielectric plate with half-wave resonance. Ключевые слова: ultrathin copper films, quartz substrate, optical coefficients, waveguide measurements, microwave range

Тип объекта: Доклад на конференции или семинаре (Доклад)
Дополнительная информация: DOI: 10.1109/RMC55984.2022.10079526
Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: Вдовин,Андреев,Пятайкин,Пинаев
Подразделения (можно выбрать несколько, удерживая Ctrl): 201 лаб. математических методов радиофизики
URI: http://cplire.ru:8080/id/eprint/8316
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