Egorov E.V., Egorov V.K. Radiation fluxes waveguide-resonance phenomenon discovered in result of X-ray nanosize beam formation study. In: “Electromagnetic propagation and waveguides in photonics and microwave engineering”, Chapter 3. Eds. P. Steiglich. London: Intech Open Press. (2020) P. 42-62. IntechOpen Limited, London , 2020 , С. 42-62.
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Аннотация
The work discussed shortly the experimental results, which was the waveguide-resonance mechanism relevation forerunner of characteristic X-ray radiation flux propagation. Technology of the planar air extended slit clearance preparations presented. The methodology of X-ray beam parameter study formed by these slit clearances, which allowed to find the critical parameter answering for the radiation flux propagation mechanism change from the multiple external total reflections to the waveguide-resonance one, is described. Main features of the X-ray flux waveguideresonance propagation mechanism were revealed. The self-consistent model of the mechanism is displayed with details. It is shown that the waveguide-resonance effect has universal character, and it reflects the fundamental nature phenomenon. The peculiarities of X-ray device functioned in frame of the phenomenon manifestation planar X-ray waveguide resonator (PXWR) and the increasing methods of its practical efficiency are discussed. The phenomenon practical application is presented concisely.
| Тип объекта: | Раздел книги |
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| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Егоров Е.В., Егоров В.К. |
| Подразделения (можно выбрать несколько, удерживая Ctrl): | 251 лаб. исследования физических явлений на поверхности и границах раздела твердых тел |
| URI: | http://cplire.ru:8080/id/eprint/7930 |
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