Snezhko A., Volkov O., Gubankov V., Gundareva I., Divin Y., Pavlovskiy V., Pokalyakin V. Frequency Characterization of Planar Resonators by THz Josephson Spectroscopy. Proc. Progress In Electromagnetics Research Symposium (Prague, Czech Republic, July 6-9, 2015) , 2015 . С. 1711-1715.
Полный текст не доступен из этого репозитория.Аннотация
Broadband electromagnetic measurement at frequencies above 100 GHz is still challenging problem because of limited frequency ranges of oscillators, complicated matching networks and ambiguous deembedding procedures. It is known that Josephson junction (JJ) is very sensitive to electromagnetic environment. Josephson terahertz spectroscopy is based on ac Josephson effect in high-temperature superconducting junctions. Here we extend this method to perform spectral characterization of planar open ring resonators on separate substrates. We have studied resonator characteristics at frequencies from 50 GHz to 700 GHz, using YBa2Cu3O7¡x high-Tc bicrystal grain boundary junctions on NdGaO3 and MgO substrates. Differential resistance vs. voltage curves modifed by the interaction of JJ with resonator have been analyzed. An excitation of fundamental resonance mode in the planar resonator by Josephson oscillations was demonstrated. The technique developed might be used for frequency characterization of THz photonic elements and structures.
| Тип объекта: | Статья |
|---|---|
| Авторы на русском. ОБЯЗАТЕЛЬНО ДЛЯ АНГЛОЯЗЫЧНЫХ ПУБЛИКАЦИЙ!: | Снежко, Волков, Губанков, Гундарева, Дивин, Павловский, Покалякин |
| Подразделения (можно выбрать несколько, удерживая Ctrl): | 183 лаб. фотоэлектронных явлений |
| URI: | http://cplire.ru:8080/id/eprint/5092 |
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